@article{09159ac53cc54330949ed99c06373a1a,
title = "Design for a 10 keV multi-pass transmission electron microscope",
abstract = "Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample.",
author = "Koppell, {Stewart A.} and Marian Mankos and Bowman, {Adam J.} and Yonatan Israel and Thomas Juffmann and Klopfer, {Brannon B.} and Kasevich, {Mark A.}",
note = "Publisher Copyright: {\textcopyright} 2019",
year = "2019",
month = dec,
doi = "10.1016/j.ultramic.2019.112834",
language = "אנגלית",
volume = "207",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
}