Deep learned phase mask for single image depth estimation and 3D scanning

Harel Haim, Shay Elmalem, Raja Giryes, Alex M. Bronstein, Emanuel Marom

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Single image depth estimation is achieved using computational imaging and Deep Learning (DL). Imaging with phase-mask is also modeled as a DL-layer, and the mask and DL parameters are jointly designed using labeled data.

Original languageEnglish
Title of host publicationComputational Optical Sensing and Imaging, COSI 2018
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
DOIs
StatePublished - 2018
EventComputational Optical Sensing and Imaging, COSI 2018 - Orlando, United States
Duration: 25 Jun 201828 Jun 2018

Publication series

NameOptics InfoBase Conference Papers
VolumePart F99-COSI 2018

Conference

ConferenceComputational Optical Sensing and Imaging, COSI 2018
Country/TerritoryUnited States
CityOrlando
Period25/06/1828/06/18

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