Deep learned phase mask for single image depth estimation and 3D scanning

Harel Haim, Shay Elmalem*, Raja Giryes, Alex M. Bronstein, Emanuel Marom

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Single image depth estimation is achieved using computational imaging and Deep Learning (DL). Imaging with phase-mask is also modeled as a DL-layer, and the mask and DL parameters are jointly designed using labeled data.

Original languageEnglish
Title of host publicationComputational Optical Sensing and Imaging, COSI 2018
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580446
DOIs
StatePublished - 2018
EventComputational Optical Sensing and Imaging, COSI 2018 - Orlando, United States
Duration: 25 Jun 201828 Jun 2018

Publication series

NameOptics InfoBase Conference Papers
VolumePart F99-COSI 2018
ISSN (Electronic)2162-2701

Conference

ConferenceComputational Optical Sensing and Imaging, COSI 2018
Country/TerritoryUnited States
CityOrlando
Period25/06/1828/06/18

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