Abstract
Leakage currents in oxidized porous silicon layers were analyzed using small-size scanning mercury probes. Current filaments with properties typical for noncoherent mesoscopic systems were revealed and investigated. It was shown that intense 1/f and random telegraph noises accompany carrier transport in local leakage channels.
| Original language | English |
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| Pages | 83-87 |
| Number of pages | 5 |
| State | Published - 1995 |
| Externally published | Yes |
| Event | Proceedings of the 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Leicester, Engl Duration: 10 Jul 1995 → 13 Jul 1995 |
Conference
| Conference | Proceedings of the 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics |
|---|---|
| City | Leicester, Engl |
| Period | 10/07/95 → 13/07/95 |