Crossover from Mott to Efros-Shklovskii variable-range-hopping conductivity in InxOy films

Ralph Rosenbaum*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

195 Scopus citations

Abstract

Crossover from Mott variable-range-hopping conductivity to the Coulomb-gap Efros-Shklovskii (ES) variable-range-hopping conductivity has been observed in amorphous indium oxide films. The hopping exponent x0.56 in the activated Coulomb-gap regime is greater than the x=0.50 value predicted by Efros and Shklovskii. The experimental value of x0.56 is in excellent agreement with the computational calculations of Mobius and Richter, who suggest that x=0.55. The experimental ratios for TMott/TES54 are in close agreement with the prediction of Castner that TMott/TES=81. Experimental values for the crossover temperatures, which separate the two hopping regimes, are consistent with predicted values. The Coulomb-gap energy CG is estimated to range from a few tenths of a meV for films close to the metal-insulator transition to several meVs for films quite deep in the insulating regime.

Original languageEnglish
Pages (from-to)3599-3603
Number of pages5
JournalPhysical Review B
Volume44
Issue number8
DOIs
StatePublished - 1991

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