Abstract
The critical currents of Al-Ge and Pb-Ge thin film alloys have been measured as a function of the metal volume fraction x. They have been found to vary as (x-x//c)**v where x//c is the value of x at the metal-insulator transition. This behaviour is similar to that of the conductances sigma of the same samples in the normal state. The results are interpreted in terms of current percolation theories.
Original language | English |
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Pages (from-to) | l. 219-l. 221 |
Journal | Journal de Physique (Paris), Lettres |
Volume | 40 |
Issue number | 10 |
DOIs | |
State | Published - 1979 |