Critical current in Nb-Cu-Nb junctions with nonideal interfaces

Y. Blum*, A. Tsukernik, M. Karpovski, A. Palevski

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

We report on experimental studies of superconductor (Nb)-normal metal (Cu)-superconductor (Nb) junctions with dirty interfaces between the different materials. By using a set of simultaneously prepared samples, we investigated the thickness dependence as well as the temperature dependence of the critical currents in the junctions. Good agreement between the decay of the measured critical currents and theoretical calculations was obtained without any fitting parameters.

Original languageEnglish
Article number214501
Pages (from-to)1-4
Number of pages4
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume70
Issue number21
DOIs
StatePublished - Dec 2004

Funding

FundersFunder number
G.I.F.
German-Israeli Foundation for Scientific Research and Development
Israel Academy of Sciences and Humanities
Israel Science Foundation

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