CoSi2 surface phase separation into self-assembled lateral multilayers

I. Goldfarb

doi:10.1063/1.1556169

CoSi₂ surface phase separation into self-assembled lateral multilayers

I. Goldfarb^*

^*Corresponding author for this work

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

CoSi₂ surface phase separation into self-assembled lateral multilayers was studied. CoSi₂ was grown on the Si(001) surface by solid-phase reaction. The solid-phase reaction was complete after a 700°C anneal followed from the reflection high-energy electron diffraction analysis. Scanning tunneling microscopy observations of the resulting surface revealed many atomic reconstructions, some apparent only under bias-dependent imaging conditions. Alternating (3 √2×2 √2)-R45° and (4√2 × 2√2)-R45° surface domains arranged in long parallel stripes was shown.

Original language	English
Pages (from-to)	1185-1187
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	8
DOIs	https://doi.org/10.1063/1.1556169
State	Published - 24 Feb 2003

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@article{41d91455ce334f73b6d9f1ffafac1654,

title = "CoSi2 surface phase separation into self-assembled lateral multilayers",

abstract = "CoSi2 surface phase separation into self-assembled lateral multilayers was studied. CoSi2 was grown on the Si(001) surface by solid-phase reaction. The solid-phase reaction was complete after a 700°C anneal followed from the reflection high-energy electron diffraction analysis. Scanning tunneling microscopy observations of the resulting surface revealed many atomic reconstructions, some apparent only under bias-dependent imaging conditions. Alternating (3 √2×2 √2)-R45° and (4√2 × 2√2)-R45° surface domains arranged in long parallel stripes was shown.",

author = "I. Goldfarb",

year = "2003",

month = feb,

day = "24",

doi = "10.1063/1.1556169",

language = "אנגלית",

volume = "82",

pages = "1185--1187",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "8",

}

TY - JOUR

T1 - CoSi2 surface phase separation into self-assembled lateral multilayers

AU - Goldfarb, I.

PY - 2003/2/24

Y1 - 2003/2/24

N2 - CoSi2 surface phase separation into self-assembled lateral multilayers was studied. CoSi2 was grown on the Si(001) surface by solid-phase reaction. The solid-phase reaction was complete after a 700°C anneal followed from the reflection high-energy electron diffraction analysis. Scanning tunneling microscopy observations of the resulting surface revealed many atomic reconstructions, some apparent only under bias-dependent imaging conditions. Alternating (3 √2×2 √2)-R45° and (4√2 × 2√2)-R45° surface domains arranged in long parallel stripes was shown.

AB - CoSi2 surface phase separation into self-assembled lateral multilayers was studied. CoSi2 was grown on the Si(001) surface by solid-phase reaction. The solid-phase reaction was complete after a 700°C anneal followed from the reflection high-energy electron diffraction analysis. Scanning tunneling microscopy observations of the resulting surface revealed many atomic reconstructions, some apparent only under bias-dependent imaging conditions. Alternating (3 √2×2 √2)-R45° and (4√2 × 2√2)-R45° surface domains arranged in long parallel stripes was shown.

UR - http://www.scopus.com/inward/record.url?scp=0037463249&partnerID=8YFLogxK

U2 - 10.1063/1.1556169

DO - 10.1063/1.1556169

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:0037463249

SN - 0003-6951

VL - 82

SP - 1185

EP - 1187

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 8

ER -

CoSi₂ surface phase separation into self-assembled lateral multilayers

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