TY - JOUR
T1 - Context-based image modelling
AU - Dvir, Guy
AU - Greenspan, Hayit
AU - Rubner, Yossi
PY - 2002
Y1 - 2002
N2 - In this work we address the task of adapting the model representation of a given image, in the context of a second, target image model. We present the BlobEMD framework, in which the images are represented as sets of blobs and optimal correspondences are found between the representations of the images and are used to adapt the representation of the source image to that of the target image. The context-based model adaptation allows for similarity measures between images that are insensitive to the segmentation process and to different levels of details of the representation. We show applications for matching models of heavily dithered images with models of full resolution images, and for content-based image segmentation where the transition from regions to representative silhouettes is shown.
AB - In this work we address the task of adapting the model representation of a given image, in the context of a second, target image model. We present the BlobEMD framework, in which the images are represented as sets of blobs and optimal correspondences are found between the representations of the images and are used to adapt the representation of the source image to that of the target image. The context-based model adaptation allows for similarity measures between images that are insensitive to the segmentation process and to different levels of details of the representation. We show applications for matching models of heavily dithered images with models of full resolution images, and for content-based image segmentation where the transition from regions to representative silhouettes is shown.
UR - http://www.scopus.com/inward/record.url?scp=33845228986&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2002.1047423
DO - 10.1109/ICPR.2002.1047423
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AN - SCOPUS:33845228986
SN - 1051-4651
VL - 16
SP - 162
EP - 165
JO - Proceedings - International Conference on Pattern Recognition
JF - Proceedings - International Conference on Pattern Recognition
IS - 4
ER -