Contact-free conductivity probing of metal nanowire films using THz reflection spectroscopy

Muriel E. Layani-Tzadka, Daniel Krotkov, Einat Tirosh, Gil Markovich, Sharly Fleischer

Research output: Contribution to journalArticlepeer-review


We utilize time-domain Terahertz (THz) reflectivity measurements for characterizing the surface conductivity of Polyethylene-terephthalate coated with nanowire (NW) films to form novel transparent electrodes (TE). We find good correspondence between the film conductivity and the THz-field reflectivity that provide uniquely desirable means for non-destructive, contactless conductivity measurements of large area NW-based-TEs. We demonstrate the robustness of THz reflectivity measurements to deviations invoked on NW film composition and film uniformity. The dependence of THz reflectivity on area NW coverage follows an anisotropic effective medium model for the dielectric constant.

Original languageEnglish
Article number215702
Issue number21
StatePublished - 14 Mar 2019


  • conductivity
  • nanowire
  • terahertz
  • transparent electrodes


Dive into the research topics of 'Contact-free conductivity probing of metal nanowire films using THz reflection spectroscopy'. Together they form a unique fingerprint.

Cite this