Constitutive parameter extraction for single & double negative metamaterials and validation of negative refraction

Yair Hollander; Reuven Shavit

doi:10.1109/APS.2007.4396063

Constitutive parameter extraction for single & double negative metamaterials and validation of negative refraction

Yair Hollander^*, Reuven Shavit

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	2007 IEEE Antennas and Propagation Society International Symposium, AP-S
Pages	2586-2589
Number of pages	4
DOIs	https://doi.org/10.1109/APS.2007.4396063
State	Published - 2007
Externally published	Yes
Event	2007 IEEE Antennas and Propagation Society International Symposium, AP-S - Honolulu, HI, United States Duration: 10 Jun 2007 → 15 Jun 2007

Publication series

Name	IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)
ISSN (Print)	1522-3965

Conference

Conference	2007 IEEE Antennas and Propagation Society International Symposium, AP-S
Country/Territory	United States
City	Honolulu, HI
Period	10/06/07 → 15/06/07

Access to Document

10.1109/APS.2007.4396063

Cite this

Hollander, Y., & Shavit, R. (2007). Constitutive parameter extraction for single & double negative metamaterials and validation of negative refraction. In 2007 IEEE Antennas and Propagation Society International Symposium, AP-S (pp. 2586-2589). Article 4396063 (IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)). https://doi.org/10.1109/APS.2007.4396063

@inproceedings{5b9ebc7269184928a8972b1925b242dc,

title = "Constitutive parameter extraction for single & double negative metamaterials and validation of negative refraction",

author = "Yair Hollander and Reuven Shavit",

year = "2007",

doi = "10.1109/APS.2007.4396063",

language = "אנגלית",

isbn = "1424408776",

series = "IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)",

pages = "2586--2589",

booktitle = "2007 IEEE Antennas and Propagation Society International Symposium, AP-S",

note = "2007 IEEE Antennas and Propagation Society International Symposium, AP-S ; Conference date: 10-06-2007 Through 15-06-2007",

}

Hollander, Y & Shavit, R 2007, Constitutive parameter extraction for single & double negative metamaterials and validation of negative refraction. in 2007 IEEE Antennas and Propagation Society International Symposium, AP-S., 4396063, IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), pp. 2586-2589, 2007 IEEE Antennas and Propagation Society International Symposium, AP-S, Honolulu, HI, United States, 10/06/07. https://doi.org/10.1109/APS.2007.4396063

Constitutive parameter extraction for single & double negative metamaterials and validation of negative refraction. / Hollander, Yair; Shavit, Reuven.
2007 IEEE Antennas and Propagation Society International Symposium, AP-S. 2007. p. 2586-2589 4396063 (IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Constitutive parameter extraction for single & double negative metamaterials and validation of negative refraction

AU - Hollander, Yair

AU - Shavit, Reuven

PY - 2007

Y1 - 2007

UR - http://www.scopus.com/inward/record.url?scp=48349107202&partnerID=8YFLogxK

U2 - 10.1109/APS.2007.4396063

DO - 10.1109/APS.2007.4396063

M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???

AN - SCOPUS:48349107202

SN - 1424408776

SN - 9781424408771

T3 - IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)

SP - 2586

EP - 2589

BT - 2007 IEEE Antennas and Propagation Society International Symposium, AP-S

T2 - 2007 IEEE Antennas and Propagation Society International Symposium, AP-S

Y2 - 10 June 2007 through 15 June 2007

ER -

Constitutive parameter extraction for single & double negative metamaterials and validation of negative refraction

Publication series

Conference

Access to Document

Other files and links

Cite this