In this article we investigate atomic force microscope friction (AFM) measurements at the SiO2/SiO2 interface. We use two approaches which differ in the way in which the surfaces are driven relative to each other in contact. The silicon tip of the AFM is driven at constant velocity or harmonically. The resulting response corresponds to either the tribological or the rheological properties at the contact. Here we bridge the gap between the two approaches which do not always lead to the same conclusions.
|Number of pages||10|
|Journal||ACS Symposium Series|
|State||Published - 2001|