Conduction centers in a Ta2O5-δ Fermi glass

Ilan Goldfarb*, R. Stanley Williams

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

We compare our photoemission spectra with the calculated energy spectra of oxygen vacancies in Ta oxide to identify the defects responsible for the formation of a band in the gap of a Ta oxide-based memristor. We have previously explained transitions between high and low resistance states in a memristor conducting channel under bias reversal by accumulation and depletion of oxygen in the channel. Oxidation leads to a higher resistance due to sparser conduction centers for the electrons to hop between. Here, we show that they are likely due to neutral oxygen vacancies located at 'in-plane' sites of the Ta-O polyhedra.

Original languageEnglish
Pages (from-to)287-289
Number of pages3
JournalApplied Physics A: Materials Science and Processing
Volume114
Issue number2
DOIs
StatePublished - Feb 2014

Funding

FundersFunder number
Defense Advanced Research Projects AgencyHR0011-09-3-0001

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