Comparison of Exchange-Bias Using Epitaxial and Polycrystalline Ir0.2Mn0.8 Antiferromagnetic Thin Films: a TEM and Lorentz TEM Study

A Kohn, A Kovacs, S-G Wang, C Wang, J Dean, T Schrefl, A Zeltser, MJ Carey, AK Petford-Long, RC C Ward

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