Comparison of Exchange-Bias Using Epitaxial and Polycrystalline Ir0.2Mn0.8 Antiferromagnetic Thin Films: a TEM and Lorentz TEM Study

A Kohn; A Kovacs; S-G Wang; C Wang; J Dean; T Schrefl; A Zeltser; MJ Carey; AK Petford-Long; RC C Ward

doi:10.1017/S1431927610056515

Comparison of Exchange-Bias Using Epitaxial and Polycrystalline Ir0.2Mn0.8 Antiferromagnetic Thin Films: a TEM and Lorentz TEM Study

A Kohn, A Kovacs, S-G Wang, C Wang, J Dean, T Schrefl, A Zeltser, MJ Carey, AK Petford-Long, RC C Ward

Research output: Contribution to journal › Article › peer-review

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Original language	American English
Pages (from-to)	1914-1915
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	16
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927610056515
State	Published - 2010
Externally published	Yes

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10.1017/S1431927610056515

https://www.cambridge.org/core/article/comparison-of-exchangebias-using-epitaxial-and-polycrystalline-ir02mn08-antiferromagnetic-thin-films-a-tem-and-lorentz-tem-study/E2C4ED5056D59D59D802D974F5951DED

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@article{35e924d762e44b358775bf725203bed3,

title = "Comparison of Exchange-Bias Using Epitaxial and Polycrystalline Ir0.2Mn0.8 Antiferromagnetic Thin Films: a TEM and Lorentz TEM Study",

abstract = "Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.",

author = "A Kohn and A Kovacs and S-G Wang and C Wang and J Dean and T Schrefl and A Zeltser and MJ Carey and AK Petford-Long and {C Ward}, RC",

year = "2010",

doi = "10.1017/S1431927610056515",

language = "American English",

volume = "16",

pages = "1914--1915",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S2",

}

TY - JOUR

T1 - Comparison of Exchange-Bias Using Epitaxial and Polycrystalline Ir0.2Mn0.8 Antiferromagnetic Thin Films: a TEM and Lorentz TEM Study

AU - Kohn, A

AU - Kovacs, A

AU - Wang, S-G

AU - Wang, C

AU - Dean, J

AU - Schrefl, T

AU - Zeltser, A

AU - Carey, MJ

AU - Petford-Long, AK

AU - C Ward, RC

PY - 2010

Y1 - 2010

N2 - Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

AB - Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

U2 - 10.1017/S1431927610056515

DO - 10.1017/S1431927610056515

M3 - Article

SN - 1431-9276

VL - 16

SP - 1914

EP - 1915

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Comparison of Exchange-Bias Using Epitaxial and Polycrystalline Ir0.2Mn0.8 Antiferromagnetic Thin Films: a TEM and Lorentz TEM Study

Abstract

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