Comments on computer investigations of micrographs of metal films near their continuity threshold

Aharon Kapitulnik*, Guy Deutscher

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

We describe and demonstrate a method of digitizing micrographs and a computer analysis method for a quantitative study of thin film morphologies.

Original languageEnglish
Pages (from-to)79-84
Number of pages6
JournalThin Solid Films
Volume113
Issue number1
DOIs
StatePublished - 9 Mar 1984

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