COMBINED ELLIPSOMETRIC AND AC IMPEDANCE MEASUREMENTS OF OXIDE FILMS ON RUTHENIUM.

J. Rishpon*, I. Reshef, S. Gottesfeld

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)1250
Number of pages1
JournalElectrochemical Society Extended Abstracts
Volume83-1
StatePublished - 1983

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