Collaborative detection of common lines in cryo EM images using maximum likelihood

Mor Cohen; Yoel Shkolnisky; Arie Yeredor

doi:10.1109/EEEI.2014.7005782

Collaborative detection of common lines in cryo EM images using maximum likelihood

Mor Cohen, Yoel Shkolnisky, Arie Yeredor

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper presents a maximum likelihood (ML) algorithm for detecting (shared) common lines between pairs of cryo-EM projection images. The algorithm is based on a global iterative detector in which we jointly estimate and classify common lines using the data from all projection images. We demonstrate by simulations that the algorithm improves the detection rate of common lines compared to state of the art methods, and operates well even with non white imaging noise.

Original language	English
Title of host publication	2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781479959877
DOIs	https://doi.org/10.1109/EEEI.2014.7005782
State	Published - 2014
Event	2014 28th IEEE Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014 - Eilat, Israel Duration: 3 Dec 2014 → 5 Dec 2014

Publication series

Name	2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014

Conference

Conference	2014 28th IEEE Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014
Country/Territory	Israel
City	Eilat
Period	3/12/14 → 5/12/14

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10.1109/EEEI.2014.7005782

Cite this

Cohen, M., Shkolnisky, Y., & Yeredor, A. (2014). Collaborative detection of common lines in cryo EM images using maximum likelihood. In 2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014 [7005782] (2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EEEI.2014.7005782

Cohen, Mor ; Shkolnisky, Yoel ; Yeredor, Arie. / Collaborative detection of common lines in cryo EM images using maximum likelihood. 2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014. Institute of Electrical and Electronics Engineers Inc., 2014. (2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014).

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Cohen, M, Shkolnisky, Y & Yeredor, A 2014, Collaborative detection of common lines in cryo EM images using maximum likelihood. in 2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014., 7005782, 2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014, Institute of Electrical and Electronics Engineers Inc., 2014 28th IEEE Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014, Eilat, Israel, 3/12/14. https://doi.org/10.1109/EEEI.2014.7005782

Collaborative detection of common lines in cryo EM images using maximum likelihood. / Cohen, Mor; Shkolnisky, Yoel ; Yeredor, Arie.

2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014. Institute of Electrical and Electronics Engineers Inc., 2014. 7005782 (2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Cohen M, Shkolnisky Y , Yeredor A. Collaborative detection of common lines in cryo EM images using maximum likelihood. In 2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014. Institute of Electrical and Electronics Engineers Inc. 2014. 7005782. (2014 IEEE 28th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2014). https://doi.org/10.1109/EEEI.2014.7005782

Collaborative detection of common lines in cryo EM images using maximum likelihood

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