Abstract
We have measured the cluster-size distribution in thin Al-Al2O3 films near the metal-insulator transition for sheet resistances of about 1000 Ω and metal area fraction of the order of 0.5. Our results show for the first time that this distribution follows a power-law dependence and that the perimeter-to-area ratio is approximately constant for large clusters. We find good quantitative agreement between our obseryations and the predictions of percolation theory.
Original language | English |
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Pages (from-to) | 2965-2967 |
Number of pages | 3 |
Journal | Physical Review B |
Volume | 25 |
Issue number | 4 |
DOIs | |
State | Published - 1982 |