Charge Transport and the Nature of Traps in Oxygen Deficient Tantalum Oxide

Vladimir A. Gritsenko, Timofey V. Perevalov, Vitalii A. Voronkovskii, Andrei A. Gismatulin*, Vladimir N. Kruchinin, Vladimir Sh Aliev, Vladimir A. Pustovarov, Igor P. Prosvirin, Yakov Roizin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

51 Scopus citations

Abstract

Optical and transport properties of nonstoichiometric tantalum oxide thin films grown by ion beam deposition were investigated in order to understand the dominant charge transport mechanisms and reveal the nature of traps. The TaOx films composition was analyzed by X-ray photoelectron spectroscopy and by quantum-chemistry simulation. From the optical absorption and photoluminescence measurements and density functional theory simulations, it was concluded that the 2.75 eV blue luminescence excited in a TaOx by 4.45 eV photons, originates from oxygen vacancies. These vacancies are also responsible for TaOx conductivity. The thermal trap energy of 0.85 eV determined from the transport experiments coincides with the half of the Stokes shift of the blue luminescence band. It is argued that the dominant charge transport mechanism in TaOx films is phonon-assisted tunneling between the traps.

Original languageEnglish
Pages (from-to)3769-3775
Number of pages7
JournalACS Applied Materials and Interfaces
Volume10
Issue number4
DOIs
StatePublished - 31 Jan 2018
Externally publishedYes

Funding

FundersFunder number
Russian Science Foundation16-19-00002, 17-72-10103

    Keywords

    • Traps
    • XPS
    • ab initio simulation
    • charge transport
    • optic
    • oxygen vacancy
    • photoluminescence

    Fingerprint

    Dive into the research topics of 'Charge Transport and the Nature of Traps in Oxygen Deficient Tantalum Oxide'. Together they form a unique fingerprint.

    Cite this