Charge loss mechanisms in a localized trapping based nonvolatile memory device

Yael Shur, Yosi Shacham-Diamand, Eli Lusky, Boaz Eitan, Assaf Shappir

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publication2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI
Pages364-365
Number of pages2
DOIs
StatePublished - 2006
Event2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI - Eilat, Israel
Duration: 15 Nov 200617 Nov 2006

Publication series

NameIEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings

Conference

Conference2006 IEEE 24th Convention of Electrical and Electronics Engineers in Israel, IEEEI
Country/TerritoryIsrael
CityEilat
Period15/11/0617/11/06

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