Characterization methodology for pseudomorphic high electron mobility transistors using surface photovoltage spectroscopy
- S. Solodky
- , M. Leibovitch
- , N. Ashkenasy
- , I. Hallakoun
- , Y. Rosenwaks
- , Yoram Shapira*
*Corresponding author for this work
- Tel Aviv University
- Elta Electronics Industries Ltd.
Research output: Contribution to journal › Article › peer-review
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