CASE HISTORY WITH AI-TEST: AN EXPERT SYSTEM FOR ELECTRONIC TROUBLESHOOTING.

Moshe Ben-Bassat; Dahpna Ben-Arie; Israel Beniaminy; Jonathan Cheifetz; Mordechai Klinger

CASE HISTORY WITH AI-TEST: AN EXPERT SYSTEM FOR ELECTRONIC TROUBLESHOOTING.

Moshe Ben-Bassat^*, Dahpna Ben-Arie, Israel Beniaminy, Jonathan Cheifetz, Mordechai Klinger

^*Corresponding author for this work

Coller School of Management

Research output: Contribution to journal › Conference article › peer-review

Abstract

AI-TEST is an expert system for functional fault detection and isolation in electronic equipment. Its main features include probabilistic diagnostic assessment and effective management of the testing process including goal-oriented test evaluation and selection. Preliminary experience with AI-TEST for troubleshooting the HP-3478A digital multimeter is reported.

Original language	English
Pages (from-to)	363-369
Number of pages	7
Journal	AUTOTESTCON (Proceedings)
State	Published - 1987

Cite this

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title = "CASE HISTORY WITH AI-TEST: AN EXPERT SYSTEM FOR ELECTRONIC TROUBLESHOOTING.",

abstract = "AI-TEST is an expert system for functional fault detection and isolation in electronic equipment. Its main features include probabilistic diagnostic assessment and effective management of the testing process including goal-oriented test evaluation and selection. Preliminary experience with AI-TEST for troubleshooting the HP-3478A digital multimeter is reported.",

author = "Moshe Ben-Bassat and Dahpna Ben-Arie and Israel Beniaminy and Jonathan Cheifetz and Mordechai Klinger",

year = "1987",

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AU - Cheifetz, Jonathan

AU - Klinger, Mordechai

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AB - AI-TEST is an expert system for functional fault detection and isolation in electronic equipment. Its main features include probabilistic diagnostic assessment and effective management of the testing process including goal-oriented test evaluation and selection. Preliminary experience with AI-TEST for troubleshooting the HP-3478A digital multimeter is reported.

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CASE HISTORY WITH AI-TEST: AN EXPERT SYSTEM FOR ELECTRONIC TROUBLESHOOTING.

Abstract

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