CASE HISTORY WITH AI-TEST: AN EXPERT SYSTEM FOR ELECTRONIC TROUBLESHOOTING.

Moshe Ben-Bassat, Dahpna Ben-Arie, Israel Beniaminy, Jonathan Cheifetz, Mordechai Klinger

Research output: Contribution to journalConference articlepeer-review

Abstract

AI-TEST is an expert system for functional fault detection and isolation in electronic equipment. Its main features include probabilistic diagnostic assessment and effective management of the testing process including goal-oriented test evaluation and selection. Preliminary experience with AI-TEST for troubleshooting the HP-3478A digital multimeter is reported.

Original languageEnglish
Pages (from-to)363-369
Number of pages7
JournalAUTOTESTCON (Proceedings)
StatePublished - 1987

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