Abstract
A method for predicting the induced overvoltages in electrical and electronic devices and circuits due to lighting strokes is presented. This method, based on the electromagnetic field concepts, enables the determination of the induced overvoltages as a function of time, by studying the electrical field strength components in the various elements of the electrical and electronic circuits. The electrical field strength components, caused by the return-stroke current waves and the compensating currents (CC), are used for calculating the induced overvoltages. With the knowledge of these induced overvoltages, better and more effective protection systems can be studied and designed.
Original language | English |
---|---|
Pages (from-to) | 227-232 |
Number of pages | 6 |
Journal | ETZ-Archiv |
Volume | 10 |
Issue number | 7 |
State | Published - Jul 1988 |