Abstract
This letter introduces a localized microwave technique for direct excitation of solid materials for the sake of their identification by atomic emission spectroscopy. The microwave energy is concentrated on the material surface by a microwave-drill type applicator. The evolved ∼1-mm3 hotspot is slightly evaporated and excited as plasma. An optical spectrometer measures the atomic emission spectrum, hence enabling the material identification as in the known laser-induced breakdown spectroscopy (LIBS) technique. The experimental results demonstrate the conceptual feasibility of the localized microwave-induced breakdown spectroscopy as a low-cost substitute for the laser-based LIBS for material identification in scenarios in which a direct contact with the material to be identified and its slight destruction are permitted.
Original language | English |
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Pages (from-to) | 2281-2283 |
Number of pages | 3 |
Journal | Microwave and Optical Technology Letters |
Volume | 53 |
Issue number | 10 |
DOIs | |
State | Published - Oct 2011 |
Keywords
- atomic emission
- breakdown spectroscopy
- microwave drill
- microwave hotspot
- plasma