Binary test design problem

Vladimir Turetsky, David M. Steinberg, Emil Bashkansky*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Unlike in traditional measurement methods, in binary testing each test item provides only one bit of information. In view of limited test resources, effective planning of the test is crucial. In this article, the general problem is formulated from the metrological point of view for a high variety of objects under test and a homogeneous item response function. Different optimization criteria are reviewed for one-item testing (single and replicated), and their advantages and disadvantages are discussed. The article concludes with preliminary recommendations for how to plan a binary test.

Original languageEnglish
Pages (from-to)20-26
Number of pages7
JournalMeasurement: Journal of the International Measurement Confederation
StatePublished - Jul 2018


  • Ability
  • Binary test
  • Difficulty
  • Optimization criteria


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