Binary test design problem

Vladimir Turetsky, David M. Steinberg, Emil Bashkansky

Research output: Contribution to journalArticlepeer-review

Abstract

Unlike in traditional measurement methods, in binary testing each test item provides only one bit of information. In view of limited test resources, effective planning of the test is crucial. In this article, the general problem is formulated from the metrological point of view for a high variety of objects under test and a homogeneous item response function. Different optimization criteria are reviewed for one-item testing (single and replicated), and their advantages and disadvantages are discussed. The article concludes with preliminary recommendations for how to plan a binary test.

Original languageEnglish
Pages (from-to)20-26
Number of pages7
JournalMeasurement: Journal of the International Measurement Confederation
Volume122
DOIs
StatePublished - Jul 2018

Keywords

  • Ability
  • Binary test
  • Difficulty
  • Optimization criteria

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