Axial all-optical super resolved imaging

Zeev Zalevsky*, Alexander Zlotnik, Amir Shemer, Eyal Ben-Eliezer, Emanuel Marom

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review


A new patented technology that is briefly described in this paper proposes an extended depth of focus element configured as binary phase-affecting, non-diffractive optical element defining a spatially low frequency phase transition that codes the lens aperture. Since this optical element contains low spatial frequencies, it is not sensitive to wavelengths and does not scatter energy towards the outer regions of the field of view. The optical element is a phase element and thus does not cause apodization and its energetic efficiency is very high. Since the optical element does not require digital post processing it is adequate for ophthalmic applications. The technology presented in this paper was developed by Xceed Imaging Ltd.

Original languageEnglish
Title of host publicationICIS '06
Subtitle of host publicationInternational Congress of Imaging Science - Final Program and Proceedings
Number of pages4
StatePublished - 2006
Externally publishedYes
EventICIS '06: 30th International Congress of Imaging Science - Rochester, NY, United States
Duration: 7 May 200611 May 2006

Publication series

NameICIS '06: International Congress of Imaging Science - Final Program and Proceedings


ConferenceICIS '06: 30th International Congress of Imaging Science
Country/TerritoryUnited States
CityRochester, NY


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