Auger Recombination and Charge-Carrier Thermalization in [Formula presented]-Cluster Photoelectron Studies

R. Busani, R. Giniger, T. Hippler, O. Cheshnovsky

Research output: Contribution to journalArticlepeer-review

Abstract

Photoelectron spectra (PES) of [Formula presented] show strong dependence of spectral features on photon energy, i.e., peak tailing and band gap filling. This dependence suggests the existence of complex photoinduced processes in parallel with the direct photodetachment process. The “corrupted” PES, taken with intermediate photon energy, carry the signature of interband absorption followed by charge-carrier thermalization and Auger electron ejection in [Formula presented]. These processes, so significant in the photophysics of bulk semiconductors and nanoparticles, have not yet been identified in clusters.

Original languageEnglish
Pages (from-to)4
Number of pages1
JournalPhysical Review Letters
Volume90
Issue number8
DOIs
StatePublished - 2003

Fingerprint

Dive into the research topics of 'Auger Recombination and Charge-Carrier Thermalization in [Formula presented]-Cluster Photoelectron Studies'. Together they form a unique fingerprint.

Cite this