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Atomic force and scanning electron microscopy of atmospheric particles
Zahava Barkay
*
, Amit Teller
, Eliezer Ganor
,
Zev Levin
,
Yoram Shapira
*
Corresponding author for this work
The Wolfson Applied Materials Research Center
Department of Materials Science and Engineering
Department of Geophysics
Department of Electrical Engineering - Physical Eng.
Tel Aviv University
Research output
:
Contribution to journal
›
Article
›
peer-review
26
Scopus citations
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Keyphrases
Atomic Force Microscopy
100%
Scanning Electron Microscopy
100%
Atomic Force
100%
Atmospheric Particles
100%
Particle Shape
25%
Two-sample
25%
SEM Analysis
25%
Mediterranean Sea
25%
Spherical Geometry
25%
Volume Measurement
25%
Mass Measurement
25%
Particle Analysis
25%
Shape Model
25%
Height Profile
25%
Aerosol
25%
Cylindrical Shape
25%
Projected Area
25%
Profile Measurement
25%
Mass Content
25%
Aerosol Particles
25%
Sulfate Aerosol
25%
Conical Geometry
25%
Laboratory Calibration
25%
Marine Sulfate
25%
Mass Analysis
25%
Mass Calculation
25%
Nitrate Aerosol
25%
Element Identification
25%
Earth and Planetary Sciences
Atomic Force Microscopy
100%
Scanning Electron Microscopy
100%
Atmospheric Particle
100%
Morphology
25%
Mediterranean Sea
25%
Mass Spectroscopy
25%
Chemical Element
25%
Material Science
Scanning Electron Microscopy
100%
Atomic Force Microscopy
100%
Particle Shape
25%
Morphology
25%
Energy-Dispersive X-Ray Spectroscopy
25%
Surface (Surface Science)
25%
Engineering
Atomic Force Microscopy
100%
Individual Particle
25%
Relative Volume
25%
Mass Element
25%
Cylindrical Shape
25%
Energy dispersive spectrometry
25%
Chemical Engineering
Chemical Element
100%