Abstract
A direct inversion method is used to transform measured intensities of He diffraction from MgO(100) over a wide energy range into the part of the interaction potential that depends on surface structure. This provides the first inversion of atom/surface scattering data. Intensities computed from the inverted potential reproduce the input data to great accuracy. The uniqueness problem of potentials obtained from diffraction experiments is discussed.
Original language | English |
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Pages (from-to) | 268-272 |
Number of pages | 5 |
Journal | Chemical Physics Letters |
Volume | 123 |
Issue number | 4 |
DOIs | |
State | Published - 17 Jan 1986 |