Application of the NUFFT for reconstruction problems in diffraction tomography

Michael M. Bronstein; Alexander M. Bronstein; Michael Zibulevsky; Haim Azhari

doi:10.1109/EEEI.2002.1178495

Application of the NUFFT for reconstruction problems in diffraction tomography

Michael M. Bronstein, Alexander M. Bronstein, Michael Zibulevsky, Haim Azhari

Technion-Israel Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	22nd Convention of Electrical and Electronics Engineers in Israel, Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	345-347
Number of pages	3
ISBN (Electronic)	0780376935
DOIs	https://doi.org/10.1109/EEEI.2002.1178495
State	Published - 2002
Externally published	Yes
Event	22nd Convention of Electrical and Electronics Engineers in Israel - Tel-Aviv, Israel Duration: 1 Dec 2002 → …

Publication series

Name	IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings
Volume	2002-January

Conference

Conference	22nd Convention of Electrical and Electronics Engineers in Israel
Country/Territory	Israel
City	Tel-Aviv
Period	1/12/02 → …

Access to Document

10.1109/EEEI.2002.1178495

Cite this

Bronstein, M. M., Bronstein, A. M., Zibulevsky, M., & Azhari, H. (2002). Application of the NUFFT for reconstruction problems in diffraction tomography. In 22nd Convention of Electrical and Electronics Engineers in Israel, Proceedings (pp. 345-347). Article 1178495 (IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings; Vol. 2002-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EEEI.2002.1178495

Bronstein, Michael M. ; Bronstein, Alexander M. ; Zibulevsky, Michael et al. / Application of the NUFFT for reconstruction problems in diffraction tomography. 22nd Convention of Electrical and Electronics Engineers in Israel, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2002. pp. 345-347 (IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings).

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title = "Application of the NUFFT for reconstruction problems in diffraction tomography",

author = "Bronstein, {Michael M.} and Bronstein, {Alexander M.} and Michael Zibulevsky and Haim Azhari",

year = "2002",

doi = "10.1109/EEEI.2002.1178495",

language = "אנגלית",

series = "IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "345--347",

booktitle = "22nd Convention of Electrical and Electronics Engineers in Israel, Proceedings",

address = "ארצות הברית",

note = "22nd Convention of Electrical and Electronics Engineers in Israel ; Conference date: 01-12-2002",

}

Bronstein, MM, Bronstein, AM, Zibulevsky, M & Azhari, H 2002, Application of the NUFFT for reconstruction problems in diffraction tomography. in 22nd Convention of Electrical and Electronics Engineers in Israel, Proceedings., 1178495, IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings, vol. 2002-January, Institute of Electrical and Electronics Engineers Inc., pp. 345-347, 22nd Convention of Electrical and Electronics Engineers in Israel, Tel-Aviv, Israel, 1/12/02. https://doi.org/10.1109/EEEI.2002.1178495

Application of the NUFFT for reconstruction problems in diffraction tomography. / Bronstein, Michael M.; Bronstein, Alexander M.; Zibulevsky, Michael et al.
22nd Convention of Electrical and Electronics Engineers in Israel, Proceedings. Institute of Electrical and Electronics Engineers Inc., 2002. p. 345-347 1178495 (IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings; Vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Bronstein MM, Bronstein AM, Zibulevsky M, Azhari H. Application of the NUFFT for reconstruction problems in diffraction tomography. In 22nd Convention of Electrical and Electronics Engineers in Israel, Proceedings. Institute of Electrical and Electronics Engineers Inc. 2002. p. 345-347. 1178495. (IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings). doi: 10.1109/EEEI.2002.1178495

Application of the NUFFT for reconstruction problems in diffraction tomography

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