An E-band 40dB dynamic range multi-tanh power detector in 0.13μm SiGe technology

R. Levinger, O. Katz, B. Sheinman, R. Carmon, R. Ben-Yishay, N. Mazor, S. Pivnik, Danny Elad, E. Socher

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper describes circuit design and measurement results of a multi-tanh bipolar rms power detector (PD) for applications in E band (65-86 GHz) frequency range. The PD is designed and fabricated in IBM 0.13um SiGe technology. In the matched frequency range, the measured input dynamic range is over 40 dB, withstanding an input power of 17dBm, with an overall sensitivity of 27.5 mV/dB. The output voltage response is nearly frequency-independent, varying by less than 1.5 dB for a given input RF power, as the RF frequency is swept across the operating frequency range. Static power consumption is 12mW from a 2.7V supply.

Original languageEnglish
Title of host publicationEuropean Microwave Week 2014
Subtitle of host publication"Connecting the Future", EuMW 2014 - Conference Proceedings; EuMIC 2014: 9th European Microwave Integrated Circuits Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages170-173
Number of pages4
ISBN (Electronic)9782874870361
DOIs
StatePublished - 23 Dec 2014
Event9th European Microwave Integrated Circuits Conference, EuMIC 2014 - Held as Part of the 17th European Microwave Week, EuMW 2014 - Rome, Italy
Duration: 6 Oct 20147 Oct 2014

Publication series

NameEuropean Microwave Week 2014: "Connecting the Future", EuMW 2014 - Conference Proceedings; EuMIC 2014: 9th European Microwave Integrated Circuits Conference

Conference

Conference9th European Microwave Integrated Circuits Conference, EuMIC 2014 - Held as Part of the 17th European Microwave Week, EuMW 2014
Country/TerritoryItaly
CityRome
Period6/10/147/10/14

Keywords

  • E band
  • SiGe BiCMOS
  • dynamic range
  • multi-tanh
  • rms translinear power detector

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