TY - GEN
T1 - An approach to outlier detection based on Bayesian probabilistic model
AU - Brailovsky, Victor L.
PY - 1996
Y1 - 1996
N2 - The problem of outlier detection is considered with reference to a piecewise-smooth signal corrupted by background Gaussian noise plus spikes. The problem of estimating the variance of background noise is considered and a robust algorithm which solves the problem in such an environment is suggested. The estimate of variance is essential for an outlier detection algorithm as well as for different algorithms for signal (image) analysis. Our approach to outlier detection is based on a Bayesian probabilistic model. The model enables selection of a set of informative tests for outlier detection. An experimental algorithm based on this approach is tested and its comparison with the median based approach is presented.
AB - The problem of outlier detection is considered with reference to a piecewise-smooth signal corrupted by background Gaussian noise plus spikes. The problem of estimating the variance of background noise is considered and a robust algorithm which solves the problem in such an environment is suggested. The estimate of variance is essential for an outlier detection algorithm as well as for different algorithms for signal (image) analysis. Our approach to outlier detection is based on a Bayesian probabilistic model. The model enables selection of a set of informative tests for outlier detection. An experimental algorithm based on this approach is tested and its comparison with the median based approach is presented.
UR - http://www.scopus.com/inward/record.url?scp=0012467136&partnerID=8YFLogxK
U2 - 10.1109/ICPR.1996.546726
DO - 10.1109/ICPR.1996.546726
M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???
AN - SCOPUS:0012467136
SN - 081867282X
SN - 9780818672828
T3 - Proceedings - International Conference on Pattern Recognition
SP - 70
EP - 74
BT - Track B
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 13th International Conference on Pattern Recognition, ICPR 1996
Y2 - 25 August 1996 through 29 August 1996
ER -