TY - GEN
T1 - An analytical approach to the calculation of EVM in clipped OFDM Signals
AU - Kotzer, Igal
AU - Har-Nevo, Smadar
AU - Sodin, Sasha
AU - Litsyn, Simon
PY - 2010
Y1 - 2010
N2 - One of the greatest drawbacks of OFDM communication systems is the high peak-to-average power ratio (PAPR) caused by various degrees of coherent summation in the signal generation using IFFT. Theoretical analysis of information capacities of such systems is difficult due to inaccuracies of models using mathematically unjustified assumptions about Gaussianity of distributions. The error-vector magnitude (EVM) of the signal after clipping is addressed. The EVM is calculated with no underlying model, and it is shown how it can be expressed as a power series of the number of tones. Thus it is concluded that although clipping should be minimized, the extent of minimization is channel and scenario dependent.
AB - One of the greatest drawbacks of OFDM communication systems is the high peak-to-average power ratio (PAPR) caused by various degrees of coherent summation in the signal generation using IFFT. Theoretical analysis of information capacities of such systems is difficult due to inaccuracies of models using mathematically unjustified assumptions about Gaussianity of distributions. The error-vector magnitude (EVM) of the signal after clipping is addressed. The EVM is calculated with no underlying model, and it is shown how it can be expressed as a power series of the number of tones. Thus it is concluded that although clipping should be minimized, the extent of minimization is channel and scenario dependent.
UR - http://www.scopus.com/inward/record.url?scp=78651236625&partnerID=8YFLogxK
U2 - 10.1109/EEEI.2010.5661957
DO - 10.1109/EEEI.2010.5661957
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AN - SCOPUS:78651236625
SN - 9781424486809
T3 - 2010 IEEE 26th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2010
SP - 193
EP - 197
BT - 2010 IEEE 26th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2010
T2 - 2010 IEEE 26th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2010
Y2 - 17 November 2010 through 20 November 2010
ER -