We present an all-electronic raster-scan imaging system for 220 GHz which is fully based on planar CMOS integrated circuit components. The emitter has been implemented in 90-nm CMOS process and delivers up to 50 μW at 220 GHz. The detector, based on a patch-antenna-coupled field-effect transistor pair has been implemented in a 150-nm CMOS process and exhibits a maximum responsivity of 180 V/W at 213 GHz and a bandwidth of 5% at FWHM. Our preliminary imaging results achieve an SNR of 20 dB at the equivalent noise bandwidth of 5 Hz.
|Title of host publication||IRMMW-THz 2012 - 37th International Conference on Infrared, Millimeter, and Terahertz Waves|
|State||Published - 2012|
|Event||37th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2012 - Wollongong, NSW, Australia|
Duration: 23 Sep 2012 → 28 Sep 2012
|Name||International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz|
|Conference||37th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2012|
|Period||23/09/12 → 28/09/12|