AITEST: a real life expert system for fault detection and isolation in electronic equipment

Moshe Ben-Bassat; Daphna Ben-Arie; Israel Binyamini; Jonathan Cheifetz; Mordechai Klinger

AITEST: a real life expert system for fault detection and isolation in electronic equipment

Moshe Ben-Bassat^*, Daphna Ben-Arie, Israel Binyamini, Jonathan Cheifetz, Mordechai Klinger

^*Corresponding author for this work

Coller School of Management

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A description is given of AITEST, a practical expert system designed to serve as a decision aid for test technicians and engineers. Oriented toward the shop-replaceable unit functional level, AITEST is designed to handle large-scale units under test that contain both analog and digital devices. The system offers assistance in the following stages of the testing process: multiple-fault hierarchical diagnosis assessment, effective goal setting, and case-adaptive test evaluation and selection once the goal is set. AITEST software, implementation, and practical experience are discussed.

Original language	English
Title of host publication	Proc 1988 Int Conf Syst Man Cybern
Publisher	Publ by IEEE
Pages	1048-1049
Number of pages	2
ISBN (Print)	7800030393
State	Published - 1988
Event	Proceedings of the 1988 International Conference on Systems, Man, and Cybernetics - Beijing/Shenyang, China Duration: 8 Aug 1988 → 12 Aug 1988

Publication series

Name	Proc 1988 Int Conf Syst Man Cybern

Conference

Conference	Proceedings of the 1988 International Conference on Systems, Man, and Cybernetics
City	Beijing/Shenyang, China
Period	8/08/88 → 12/08/88

Cite this

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title = "AITEST: a real life expert system for fault detection and isolation in electronic equipment",

abstract = "A description is given of AITEST, a practical expert system designed to serve as a decision aid for test technicians and engineers. Oriented toward the shop-replaceable unit functional level, AITEST is designed to handle large-scale units under test that contain both analog and digital devices. The system offers assistance in the following stages of the testing process: multiple-fault hierarchical diagnosis assessment, effective goal setting, and case-adaptive test evaluation and selection once the goal is set. AITEST software, implementation, and practical experience are discussed.",

author = "Moshe Ben-Bassat and Daphna Ben-Arie and Israel Binyamini and Jonathan Cheifetz and Mordechai Klinger",

year = "1988",

language = "אנגלית",

isbn = "7800030393",

series = "Proc 1988 Int Conf Syst Man Cybern",

publisher = "Publ by IEEE",

pages = "1048--1049",

booktitle = "Proc 1988 Int Conf Syst Man Cybern",

note = "null ; Conference date: 08-08-1988 Through 12-08-1988",

}

Ben-Bassat, M, Ben-Arie, D, Binyamini, I, Cheifetz, J & Klinger, M 1988, AITEST: a real life expert system for fault detection and isolation in electronic equipment. in Proc 1988 Int Conf Syst Man Cybern. Proc 1988 Int Conf Syst Man Cybern, Publ by IEEE, pp. 1048-1049, Proceedings of the 1988 International Conference on Systems, Man, and Cybernetics, Beijing/Shenyang, China, 8/08/88.

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AU - Ben-Bassat, Moshe

AU - Ben-Arie, Daphna

AU - Binyamini, Israel

AU - Cheifetz, Jonathan

AU - Klinger, Mordechai

PY - 1988

Y1 - 1988

N2 - A description is given of AITEST, a practical expert system designed to serve as a decision aid for test technicians and engineers. Oriented toward the shop-replaceable unit functional level, AITEST is designed to handle large-scale units under test that contain both analog and digital devices. The system offers assistance in the following stages of the testing process: multiple-fault hierarchical diagnosis assessment, effective goal setting, and case-adaptive test evaluation and selection once the goal is set. AITEST software, implementation, and practical experience are discussed.

AB - A description is given of AITEST, a practical expert system designed to serve as a decision aid for test technicians and engineers. Oriented toward the shop-replaceable unit functional level, AITEST is designed to handle large-scale units under test that contain both analog and digital devices. The system offers assistance in the following stages of the testing process: multiple-fault hierarchical diagnosis assessment, effective goal setting, and case-adaptive test evaluation and selection once the goal is set. AITEST software, implementation, and practical experience are discussed.

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SN - 7800030393

T3 - Proc 1988 Int Conf Syst Man Cybern

SP - 1048

EP - 1049

BT - Proc 1988 Int Conf Syst Man Cybern

PB - Publ by IEEE

Y2 - 8 August 1988 through 12 August 1988

ER -

AITEST: a real life expert system for fault detection and isolation in electronic equipment

Abstract

Publication series

Conference

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