Aitest: A real life expert system for electronic troublshooting and test management

Moshe Ben-Bassat, Daphna Ben-Arie, Inna Ben-Zvi, Israel Binyamini, Jonathan Cheifetz, Mordechai Sela, Michal Snalev

Research output: Contribution to conferencePaperpeer-review

Original languageEnglish
DOIs
StatePublished - 1989
Event16th Conference of Electrical and Electronics Engineers in Israel, EEIS 1989 - Tel-Aviv, Israel
Duration: 7 Mar 19899 Mar 1989

Conference

Conference16th Conference of Electrical and Electronics Engineers in Israel, EEIS 1989
Country/TerritoryIsrael
CityTel-Aviv
Period7/03/899/03/89

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