A TEM structural study of thermal stability of magnetic tunnel junctions integrated with CMOS devices

V. K. Lazarov, A. Kohn, T. Uhrmann, T. Dimopoulos, H. Brückl, H. Achard, C. Baraduc, S. Vizzini, H. Oughaddou, B. Aufray, A. D'Avitaya

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'A TEM structural study of thermal stability of magnetic tunnel junctions integrated with CMOS devices'. Together they form a unique fingerprint.

Physics & Astronomy