A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides

Adham Basha; George Levi; Tamir Amrani; Yang Li; Guy Ankonina; Pini Shekhter; Lior Kornblum; Ilan Goldfarb; Amit Kohn

doi:10.1017/S143192762200352X

A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides

Adham Basha, George Levi, Tamir Amrani, Yang Li, Guy Ankonina, Pini Shekhter, Lior Kornblum, Ilan Goldfarb, Amit Kohn

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

Original language	American English
Pages (from-to)	774-778
Number of pages	5
Journal	Microscopy and Microanalysis
Volume	28
Issue number	S1
DOIs	https://doi.org/10.1017/S143192762200352X
State	Published - 2022

Access to Document

10.1017/S143192762200352X

https://www.cambridge.org/core/article/straightforward-method-for-measuring-the-elastic-and-inelastic-mean-free-paths-for-scattering-of-fast-electrons-in-technologically-important-thinfilm-oxides/32453E6243D6F56B1D468F306FA229C3

Cite this

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title = "A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides",

author = "Adham Basha and George Levi and Tamir Amrani and Yang Li and Guy Ankonina and Pini Shekhter and Lior Kornblum and Ilan Goldfarb and Amit Kohn",

year = "2022",

doi = "10.1017/S143192762200352X",

language = "American English",

volume = "28",

pages = "774--778",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

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T1 - A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides

AU - Basha, Adham

AU - Levi, George

AU - Amrani, Tamir

AU - Li, Yang

AU - Ankonina, Guy

AU - Shekhter, Pini

AU - Kornblum, Lior

AU - Goldfarb, Ilan

AU - Kohn, Amit

PY - 2022

Y1 - 2022

U2 - 10.1017/S143192762200352X

DO - 10.1017/S143192762200352X

M3 - Article

SN - 1431-9276

VL - 28

SP - 774

EP - 778

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S1

ER -