Abstract
A novel sensing structure and realization method is proposed for complementary metal-oxide semiconductor (CMOS) compatible thermoelectric uncooled infrared microsensors. The structure enables high sensitivity and excellent thermal isolation in sensor pixels with small dimensions suitable for two-dimensional thermal imaging. Front-side dry micromachining allows fast CMOS post-processing, small pixel pitch and integration with on-chip CMOS readout. Prototype sensors with an area of 70 × 70 μm2 achieved a measured noise equivalent power of 0.36 nW Hz-1/2 and a response time of 3 ms.
Original language | English |
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Pages (from-to) | 574-576 |
Number of pages | 3 |
Journal | Journal of Micromechanics and Microengineering |
Volume | 11 |
Issue number | 5 |
DOIs | |
State | Published - Sep 2001 |
Externally published | Yes |