A novel method for characterizing optically locked devices

Oded Raz; Moshe Tur

doi:10.1109/LEOSST.2002.1027588

A novel method for characterizing optically locked devices

Oded Raz, Moshe Tur

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A new method for characterizing optically locked devices is suggested. By using a modulation side band as a scanning signal and a FP tunable filter for detection, high resolution optical spectrum can be obtained.

Original language	English
Title of host publication	2002 IEEE/LEOS - Summer Topical Meeting
Subtitle of host publication	All-Optical Networking: Existing and Emerging Architecture and Applications
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	37-38
Number of pages	2
ISBN (Electronic)	0780373782
DOIs	https://doi.org/10.1109/LEOSST.2002.1027588
State	Published - 2002
Event	IEEE/LEOS - Summer Topical Meeting - Mont Tremblant, Canada Duration: 15 Jul 2002 → 17 Jul 2002

Publication series

Name	LEOS Summer Topical Meeting
Volume	2002-January
ISSN (Print)	1099-4742

Conference

Conference	IEEE/LEOS - Summer Topical Meeting
Country/Territory	Canada
City	Mont Tremblant
Period	15/07/02 → 17/07/02

Access to Document

10.1109/LEOSST.2002.1027588

Cite this

Raz, O., & Tur, M. (2002). A novel method for characterizing optically locked devices. In 2002 IEEE/LEOS - Summer Topical Meeting: All-Optical Networking: Existing and Emerging Architecture and Applications (pp. 37-38). [1027588] (LEOS Summer Topical Meeting; Vol. 2002-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/LEOSST.2002.1027588

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title = "A novel method for characterizing optically locked devices",

abstract = "A new method for characterizing optically locked devices is suggested. By using a modulation side band as a scanning signal and a FP tunable filter for detection, high resolution optical spectrum can be obtained.",

author = "Oded Raz and Moshe Tur",

note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; IEEE/LEOS - Summer Topical Meeting ; Conference date: 15-07-2002 Through 17-07-2002",

year = "2002",

doi = "10.1109/LEOSST.2002.1027588",

language = "אנגלית",

series = "LEOS Summer Topical Meeting",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Raz, O & Tur, M 2002, A novel method for characterizing optically locked devices. in 2002 IEEE/LEOS - Summer Topical Meeting: All-Optical Networking: Existing and Emerging Architecture and Applications., 1027588, LEOS Summer Topical Meeting, vol. 2002-January, Institute of Electrical and Electronics Engineers Inc., pp. 37-38, IEEE/LEOS - Summer Topical Meeting, Mont Tremblant, Canada, 15/07/02. https://doi.org/10.1109/LEOSST.2002.1027588

A novel method for characterizing optically locked devices. / Raz, Oded; Tur, Moshe.
2002 IEEE/LEOS - Summer Topical Meeting: All-Optical Networking: Existing and Emerging Architecture and Applications. Institute of Electrical and Electronics Engineers Inc., 2002. p. 37-38 1027588 (LEOS Summer Topical Meeting; Vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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A novel method for characterizing optically locked devices

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