TY - GEN
T1 - A mixed time-frequency-scale analysis of the hybrid wavefront-resonance representation
AU - Arev, Amos
AU - Heyman, Ehud
AU - Steinberg, Ben Zion
N1 - Publisher Copyright:
© 1999 Kluwer Academic/Plenum Publ.
PY - 1998
Y1 - 1998
N2 - Several time-frequency-scale processing schemes for the analysis of short pulse scattering fields are explored and calibrated in connection with the problem of reflections from multilayered dispersive media. The time-frequency signature consists of a (generally nonuniform) grid of wavefront arrivals and resonances. It is shown that the time-frequency resolution is bound by the unit-cell area, hence the signature of a particular wave process can be detected only if the processing windows are scale-matched to corresponding unit cells. The short-time Fourier transform (STFT) has therefore an inherent limitation because it has a built in scale, while the wavelet transform with a Morlet wavelet provides a framework that adapts to all scales with no a-priori information while retaining the frequency signature of the resonances. Localized scrutiny of a specific scale may then be achieved using the STFT, while super resolution may be achieved using a model based analysis.
AB - Several time-frequency-scale processing schemes for the analysis of short pulse scattering fields are explored and calibrated in connection with the problem of reflections from multilayered dispersive media. The time-frequency signature consists of a (generally nonuniform) grid of wavefront arrivals and resonances. It is shown that the time-frequency resolution is bound by the unit-cell area, hence the signature of a particular wave process can be detected only if the processing windows are scale-matched to corresponding unit cells. The short-time Fourier transform (STFT) has therefore an inherent limitation because it has a built in scale, while the wavelet transform with a Morlet wavelet provides a framework that adapts to all scales with no a-priori information while retaining the frequency signature of the resonances. Localized scrutiny of a specific scale may then be achieved using the STFT, while super resolution may be achieved using a model based analysis.
UR - http://www.scopus.com/inward/record.url?scp=85051860164&partnerID=8YFLogxK
U2 - 10.1109/UWBSP.1998.818969
DO - 10.1109/UWBSP.1998.818969
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AN - SCOPUS:85051860164
T3 - Ultra-Wideband Short-Pulse Electromagnetics 4
SP - 361
EP - 370
BT - Ultra-Wideband Short-Pulse Electromagnetics 4
A2 - Heyman, Ehud
A2 - Mandelbaum, Benjamin
A2 - Shiloh, Joseph
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 4th Conference on Ultra-Wideband Short-Pulse Electromagnetics, UWBSP 1998
Y2 - 14 June 1999 through 19 June 1999
ER -