A microcontroller for in situ single-crystal diffraction measurements with a PILATUS-2M detector under an alternating electric field

Hyeokmin Choe; Stefan Heidbrink; Michael Ziolkowski; Ullrich Pietsch; Vadim Dyadkin; Semën Gorfman; Dmitry Chernyshov

doi:10.1107/S1600576717006197

A microcontroller for in situ single-crystal diffraction measurements with a PILATUS-2M detector under an alternating electric field

Hyeokmin Choe, Stefan Heidbrink, Michael Ziolkowski, Ullrich Pietsch, Vadim Dyadkin, Semën Gorfman, Dmitry Chernyshov

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

A new data acquisition system for in situ time-resolved three-dimensional reciprocal space mapping is reported. The system is based on a programmable microcontroller for generating a functional low-voltage signal, a pixel area detector serving as a master clock and a high-voltage amplifier. Both Bragg and diffuse scattering can be mapped in a large volume of reciprocal space under an alternating electric field of a pre-programmed shape. The system has been tested at the Swiss-Norwegian Beamline BM01 of the European Synchrotron by measuring the electric field dependence of diffuse X-ray scattering from a functional perovskite-based ferroelectric single crystal.A new data acquisition system is proposed for in situ single-crystal diffraction with a pixel area detector under an alternating electric field.

Original language	English
Pages (from-to)	975-977
Number of pages	3
Journal	Journal of Applied Crystallography
Volume	50
Issue number	3
DOIs	https://doi.org/10.1107/S1600576717006197
State	Published - Jun 2017

Keywords

ferroelectric perovskites
in situ three-dimensional reciprocal space mapping

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10.1107/S1600576717006197

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title = "A microcontroller for in situ single-crystal diffraction measurements with a PILATUS-2M detector under an alternating electric field",

abstract = "A new data acquisition system for in situ time-resolved three-dimensional reciprocal space mapping is reported. The system is based on a programmable microcontroller for generating a functional low-voltage signal, a pixel area detector serving as a master clock and a high-voltage amplifier. Both Bragg and diffuse scattering can be mapped in a large volume of reciprocal space under an alternating electric field of a pre-programmed shape. The system has been tested at the Swiss-Norwegian Beamline BM01 of the European Synchrotron by measuring the electric field dependence of diffuse X-ray scattering from a functional perovskite-based ferroelectric single crystal.A new data acquisition system is proposed for in situ single-crystal diffraction with a pixel area detector under an alternating electric field.",

keywords = "ferroelectric perovskites, in situ three-dimensional reciprocal space mapping",

author = "Hyeokmin Choe and Stefan Heidbrink and Michael Ziolkowski and Ullrich Pietsch and Vadim Dyadkin and Sem{\"e}n Gorfman and Dmitry Chernyshov",

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doi = "10.1107/S1600576717006197",

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AU - Choe, Hyeokmin

AU - Heidbrink, Stefan

AU - Ziolkowski, Michael

AU - Pietsch, Ullrich

AU - Dyadkin, Vadim

AU - Gorfman, Semën

AU - Chernyshov, Dmitry

N1 - Publisher Copyright: © International Union of Crystallography, 2017.

PY - 2017/6

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AB - A new data acquisition system for in situ time-resolved three-dimensional reciprocal space mapping is reported. The system is based on a programmable microcontroller for generating a functional low-voltage signal, a pixel area detector serving as a master clock and a high-voltage amplifier. Both Bragg and diffuse scattering can be mapped in a large volume of reciprocal space under an alternating electric field of a pre-programmed shape. The system has been tested at the Swiss-Norwegian Beamline BM01 of the European Synchrotron by measuring the electric field dependence of diffuse X-ray scattering from a functional perovskite-based ferroelectric single crystal.A new data acquisition system is proposed for in situ single-crystal diffraction with a pixel area detector under an alternating electric field.

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A microcontroller for in situ single-crystal diffraction measurements with a PILATUS-2M detector under an alternating electric field

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Keywords

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