A microcontroller for in situ single-crystal diffraction measurements with a PILATUS-2M detector under an alternating electric field

Hyeokmin Choe, Stefan Heidbrink, Michael Ziolkowski, Ullrich Pietsch, Vadim Dyadkin, Semën Gorfman, Dmitry Chernyshov

Research output: Contribution to journalArticlepeer-review

Abstract

A new data acquisition system for in situ time-resolved three-dimensional reciprocal space mapping is reported. The system is based on a programmable microcontroller for generating a functional low-voltage signal, a pixel area detector serving as a master clock and a high-voltage amplifier. Both Bragg and diffuse scattering can be mapped in a large volume of reciprocal space under an alternating electric field of a pre-programmed shape. The system has been tested at the Swiss-Norwegian Beamline BM01 of the European Synchrotron by measuring the electric field dependence of diffuse X-ray scattering from a functional perovskite-based ferroelectric single crystal.A new data acquisition system is proposed for in situ single-crystal diffraction with a pixel area detector under an alternating electric field.

Original languageEnglish
Pages (from-to)975-977
Number of pages3
JournalJournal of Applied Crystallography
Volume50
Issue number3
DOIs
StatePublished - Jun 2017

Keywords

  • ferroelectric perovskites
  • in situ three-dimensional reciprocal space mapping

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