A method for Fermi energy measurements

A. Tsukernik, M. Slutzky, A. Palevski, S. Luryi, H. Shtrikman

Research output: Contribution to journalReview articlepeer-review


We describe a method of Fermi energy measurement, based on the analysis of thermionic emission and diffusion over a barrier with a built-in charge. The method can be applied to a variety of semiconductors and has been successfully tested by measuring the Fermi energy in GaAs.

Original languageEnglish
Pages (from-to)79-81
Number of pages3
JournalApplied Physics Letters
Issue number1
StatePublished - 1998


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