@article{d217bbf4c324464b9b7052e0106597d9,
title = "A Filtered-Transform Scanning Microscopic Method for Refractive-Index Profiling of Optical Waveguides and Surface Profiling",
abstract = "In order to meet the continuing and growing interest in direct optical measurement of the refractive-index profiles of optical waveguides and surface corrugation profiles, we have developed a new filtered-transform scanning microscopic method. The method determines nondestructively the parameters that describe the index or surface profiles.",
author = "Shlomo Ruschin and Xu, {Jing Yu} and Haeyang Chung and Chang, {William S.C.}",
note = "Funding Information: Manuscript received March 27, 1990. This work was supported in part by the National Science Foundation under Grant EET-87-03241. S. Ruschin is with the Faculty of Engineering, Department of Electron Devices, Tel-Aviv University, Ramat-Aviv 69978, Israel. J.-Y. Xu, H. Chung, and W. S. C. Chang are with the Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093-0407. IEEE Log Number 9037969.",
year = "1990",
month = nov,
doi = "10.1109/50.60569",
language = "אנגלית",
volume = "8",
pages = "1703--1708",
journal = "Journal of Lightwave Technology",
issn = "0733-8724",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "11",
}