TY - JOUR
T1 - A combined system for automated ellipsometry and for network analysis based on a microcomputer
AU - Rishpon, J.
AU - Reshef, I.
AU - Gottesfeld, S.
PY - 1985/1/1
Y1 - 1985/1/1
N2 - A Microcomputer has been employed for the automation of two types of measurements: Ellipsometry, and ac impedance in a wide frequency range (“network analysis”). These measurements are combined in the characterization of electrochemical interfaces. An identical simple and fast algorithm has been employed in both cases for the digital analysis of a sinusoidal signal. The rotating analyzer ellipsometer has a time resolution of 0,01 sec and a precision of 0.01 deg, following 1 sec integration time. The network analyzer generates a complex plane plot in the range of 10mHz-1kHz in 5 min. These specification have been achieved by employing only basic electrochemical instrumentation and a manual el1ipsometer, in conjunction with a low cost microcomputer.
AB - A Microcomputer has been employed for the automation of two types of measurements: Ellipsometry, and ac impedance in a wide frequency range (“network analysis”). These measurements are combined in the characterization of electrochemical interfaces. An identical simple and fast algorithm has been employed in both cases for the digital analysis of a sinusoidal signal. The rotating analyzer ellipsometer has a time resolution of 0,01 sec and a precision of 0.01 deg, following 1 sec integration time. The network analyzer generates a complex plane plot in the range of 10mHz-1kHz in 5 min. These specification have been achieved by employing only basic electrochemical instrumentation and a manual el1ipsometer, in conjunction with a low cost microcomputer.
UR - http://www.scopus.com/inward/record.url?scp=84946265659&partnerID=8YFLogxK
U2 - 10.1080/10739148508543570
DO - 10.1080/10739148508543570
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AN - SCOPUS:84946265659
VL - 14
SP - 105
EP - 126
JO - Instrumentation Science and Technology
JF - Instrumentation Science and Technology
SN - 1073-9149
IS - 2
ER -