Keyphrases
Scanning Kelvin Probe Force Microscopy (SKPFM)
74%
Electrostatically Formed Nanowire
46%
Semiconductors
34%
Gallium Arsenide
24%
Time-resolved Photoluminescence
24%
Silicon Nanowires (SiNWs)
22%
Nanowire Transistor
21%
Surface Recombination Velocity
20%
Transistor
20%
Nanowires
19%
Field-effect Transistors
17%
Electric Field (E-field)
16%
Ferroelectric Domains
16%
Atomic Force Microscopy
15%
Surface Potential
15%
Direct Measurement
15%
Energy Distribution
14%
Work Function
13%
Atomic Force Microscope
13%
Silicon-on-insulator
13%
Contact Potential Difference
12%
Band Gap
12%
Photon-enhanced Thermionic Emission
12%
Electronic Properties
12%
Surface States
11%
Density of States
11%
Nanometer Scale
11%
Grain Boundary
10%
Surface Photovoltage Spectroscopy
10%
Nanowire Sensors
10%
Photosystem I (PS I)
10%
Field Effect
10%
Semiconductor Surface
9%
Photovoltage
9%
Solar Converter
9%
Multiple States
9%
P-n Junction
9%
Conversion Efficiency
9%
Order of Magnitude
8%
Dopant Distribution
8%
Epilayer
8%
Picosecond
8%
Ultra-high Vacuum
8%
Surface Photovoltage
8%
Ferroelectric Crystal
8%
Photoluminescence
8%
Cadmium Selenide
7%
Silicon Oxide
7%
Si(111)
7%
Volatile Organic Compounds
7%
Material Science
Surface (Surface Science)
100%
Nanowire
65%
Silicon
36%
Transistor
32%
Ferroelectric Material
29%
Density
29%
Gallium Arsenide
27%
Monolayers
27%
Field Effect Transistor
22%
Photoluminescence
22%
Atomic Force Microscopy
13%
Doping (Additives)
12%
Luminescence
12%
Electron Transfer
11%
Grain Boundary
11%
Photosystem
10%
Quantum Well
10%
Film
10%
Electronic Property
9%
Thin Films
9%
Gas Sensor
8%
Oxide Compound
8%
Thin-Film Transistor
8%
Solar Cell
8%
Cathode
8%
Single Crystal
8%
Epilayers
7%
Hot Electron
6%
Carrier Concentration
6%
Palladium
6%
Scanning Probe Microscopy
6%
Surface Charge
5%
Heterojunction
5%
Electronic Circuit
5%
Liquid Interface
5%
Photovoltaics
5%
Transition Metal Dichalcogenide
5%
Self Assembly
5%
Engineering
Nanowire
61%
Surface Recombination Velocity
20%
Electric Field
19%
Gallium Arsenide
18%
Surface Potential
14%
Field-Effect Transistor
14%
Nanoscale
13%
Atomic Force Microscope
13%
Nanometre
13%
Surface Photovoltage
13%
Band Gap
12%
Atomic Force Microscopy
12%
Energy Distribution
11%
Conversion Efficiency
11%
Silicon on Insulator
10%
Quantum Well
10%
Surface State
9%
Monolayers
9%
Minority Carriers
9%
Band Bending
9%
Ferroelectric Crystal
8%
Domain Structure
8%
Picosecond
8%
Potential Difference
7%
Dielectrics
7%
Bulk Crystal
6%
Electronic State
6%
Dopants
6%
Potential Distribution
6%
Semiconductor Surface
6%
Carrier Lifetime
6%
Fermi Level
6%
Electrical Measurement
6%
Junction Cell
5%
Silicon Oxide
5%
Gas Sensor
5%
Photovoltage
5%
Scanning Probe Microscopy
5%
Interface State
5%
Temperature Range
5%
Hot Electron
5%
