Yoram Shapira

Professor

1975 …2010

Research activity per year

If you made any changes in Pure these will be visible here soon.
Filter
Conference contribution

Search results

  • 2010

    Impact of impedance mismatch of on-die interconnects and logic cells on device reliability and functionality

    Livshits, P., Gurfinkel, M., Rysin, A., Sofer, S., Shapira, Y. & Fefer, Y., 2010, Advanced Metallization Conference 2009, AMC 2009. p. 223-228 6 p. (Advanced Metallization Conference (AMC)).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2009

    Inter-Symbol Interference (ISI) in on-die transmission lines

    Rysin, A., Livshits, P., Sofer, S., Mantel, O., Shapira, Y. & Fefer, Y., 2009, 2009 IEEE International Conference on Microwaves, Communications, Antennas and Electronics Systems, COMCAS 2009. 5385987. (2009 IEEE International Conference on Microwaves, Communications, Antennas and Electronics Systems, COMCAS 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2008

    Resonance properties of power supply and ground distribution networks in SoC

    Rozen, A., Livshits, P., Fefer, Y. & Shapira, Y., 2008, 2008 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems, COMCAS 2008. 4562826. (2008 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems, COMCAS 2008).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Supply signal fluctuations due to chip power grid resonance - A new reliability concern

    Gurfinkel, M., Livshits, P., Rozen, A., Fefer, Y., Bernstein, J. B. & Shapira, Y., 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 721-722 2 p. 4559006. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2007

    A new ultra-fast charge pumping measurement technique for NIT characterization without relaxation

    Habersat, D. B., Gurfinkel, M., Horst, J., Kim, J., Xiong, H. D., Cheung, K., Suehle, J. S., Lelis, A. J., Bemstein, J. B. & Shapira, Y., 2007, 2007 International Semiconductor Device Research Symposium, ISDRS. 4422384. (2007 International Semiconductor Device Research Symposium, ISDRS).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Characterization of interface and bulk oxide traps in SiC MOSFETs with epitaxialy grown and implanted channels

    Gurfinkel, M., Kim, J., Potbhare, S., Xiong, H. D., Cheung, K. P., Suehle, J., Bernstein, J. B., Shapira, Y., Lelis, A. J., Habersat, D. & Goldsman, N., 2007, 2007 IEEE International Integrated Reliability Workshop Final Report, IRW. p. 111-113 3 p. 4469233. (IEEE International Integrated Reliability Workshop Final Report).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Ultra-fast characterization of transient gate oxide trapping in SiC MOSFETs

    Gurfinkel, M., Suehle, J., Bernstein, J. B., Shapira, Y., Lelis, A. J., Habersat, D. & Goldsman, N., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 462-466 5 p. 4227675. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2006

    Enhanced gate induced drain leakage current in HfO2 MOSFETs due to remote interface trap-assisted tunneling

    Gurfinkel, M., Suehle, J. S., Bernstein, J. B. & Shapira, Y., 2006, 2006 International Electron Devices Meeting Technical Digest, IEDM. 4154315. (Technical Digest - International Electron Devices Meeting, IEDM).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Indirect electrostatic discharge stressing mechanism in VLSI chips with multiple power supply domains

    Sofer, S., Fefer, Y. & Shapira, Y., 2006, ISTFA 2006 - Conference Proceedings from the 32nd International Symposium for Testing and Failure Analysis. p. 389-392 4 p. (Conference Proceedings from the International Symposium for Testing and Failure Analysis; vol. 2006).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Inductance considerations of on-chip interconnections for best electrostatic discharge protection performance

    Sofer, S., Fefer, Y. & Shapira, Y., 2006, Proceedings of 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2006. p. 158-162 5 p. 4017045. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Novel method for debug of electrostatic discharge protection in VLSI circuits

    Sofer, S., Fefer, Y., Borenshtein, M. & Shapira, Y., 2006, Proceedings of 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2006. p. 265-269 5 p. 4017068. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Ultra-fast measurements of VTH instability in SiC MOSFETs due to positive and negative constant bias stress

    Gurfinkel, M., Suehle, J., Bernstein, J. B., Shapira, Y., Lelis, A. J., Habersat, D. & Goldsman, N., 2006, 2006 IEEE International Integrated Reliability Workshop Final Report, IIRW. p. 49-53 5 p. 4098686. (IEEE International Integrated Reliability Workshop Final Report).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2005

    Direct monitoring of hot-carrier accumulated charge in GaN HEMT and PHEMT devices

    Stopel, A., Khramtsov, A., Katz, O., Solodky, S., Baksht, T., Knafo, Y., Leibovitch, M. & Shapira, Y., 2005, 2005 International Conference on Compound Semiconductor Manufacturing Technology. (2005 International Conference on Compound Semiconductor Manufacturing Technology).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Investigation of contact metal stacks for submicron GaN HEMT

    Knafo, Y., Toledo, I., Hallakoun, I., Kaplun, J., Bunin, G., Baksht, T., Hadad, B. & Shapira, Y., 2005, 2005 International Conference on Compound Semiconductor Manufacturing Technology. (2005 International Conference on Compound Semiconductor Manufacturing Technology).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Re-configurable MMIC: On-wafer fine tuning capabilities

    Vazokha, M., Solodky, S., Ben-Or, R., Kaplun, J., Ortenberg, I., Leibovitch, M. & Shapira, Y., 2005, 2005 International Conference on Compound Semiconductor Manufacturing Technology. (2005 International Conference on Compound Semiconductor Manufacturing Technology).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Study of leakage-induced photon emission processes in sub-90 nm CMOS devices

    Weizman, Y., Gurfinkel, M., Margulis, A., Fefer, Y., Shapira, Y. & Baruch, E., 2005, 2005 International Semiconductor Device Research Symposium. p. 44-45 2 p. 1595968. (2005 International Semiconductor Device Research Symposium; vol. 2005).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2002

    Optimization of PHEMT geometry for power applications

    Solodky, S., Baksht, T., Shapira, Y., Leibovich, M. & Bunin, G., 2002, 22nd Convention of Electrical and Electronics Engineers in Israel, Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 61-62 2 p. 1178322. (IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings; vol. 2002-January).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 1984

    STUDIES OF SURFACE RECOMBINATION VELOCITY REDUCTION ON InP PHOTOELECTROCHEMICAL SOLAR CELLS.

    Shapira, Y., Brillson, L. J. & Heller, A., 1984, Commission of the European Communities, (Report) EUR. D. Reidel Publ Co, p. 72-76 5 p. (Commission of the European Communities, (Report) EUR).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review