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Yakov Roizin

Professor

Former affiliation
1995 …2024

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  • 2020

    Modeling a Floating-Gate Memristive Device for Computer Aided Design of Neuromorphic Computing

    Danial, L., Gupta, V., Pikhay, E., Roizin, Y. & Kvatinsky, S., Mar 2020, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E.-I. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 472-477 6 p. 9116354. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    5 Scopus citations

  • Silicon dosimeters based on Floating Gate Sensor: Design, implementation and characterization

    Gatti, U., Calligaro, C., Parlato, A., Tomarchio, E. A. G., Pikhay, E. & Roizin, Y., Jun 2020, 20th IEEE Mediterranean Electrotechnical Conference, MELECON 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 388-392 5 p. 9140654. (20th IEEE Mediterranean Electrotechnical Conference, MELECON 2020 - Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • 2019

    Image sensor module and a method for evaluating an image sensor

    Goldovsky, V., Roizin, Y., Strum, A., Fenigstein, A., Davidovich, Y., Lahav, A. & Avner, D., 2019, Optical Sensors 2019. Baldini, F., Homola, J. & Lieberman, R. A. (eds.). SPIE, 1102819. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 11028).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • 2016

    Re-usable 180nm CMOS dosimeter based on a floating gate device

    Pikhay, E., Roizin, Y., Gatti, U. & Calligaro, C., 2016, 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016. Institute of Electrical and Electronics Engineers Inc., p. 125-128 4 p. 7841148. (2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    3 Scopus citations
  • 2014

    Radiation-hardened techniques for CMOS flash ADC

    Gatti, U., Calligaro, C., Pikhay, E. & Roizin, Y., 2014, 2014 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014. Institute of Electrical and Electronics Engineers Inc., p. 1-4 4 p. 7049906. (2014 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    11 Scopus citations
  • 2013

    Non volatile memory for FPGA booting in space

    Arbat, A., Calligaro, C., Dayan, V., Pikhay, E. & Roizin, Y., 2013, Proceedings of the 2013 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2013. p. 204-208 5 p. 6604247. (Proceedings of the 2013 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2013).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    4 Scopus citations
  • 2012

    Foundry technologies focused on environmental and ecological applications

    Roizin, Y., Lisiansky, M. & Pikhay, E., 2012, Nanodevices and Nanomaterials for Ecological Security. Shunin, Y. & Kiv, A. (eds.). p. 215-224 10 p. (NATO Science for Peace and Security Series B: Physics and Biophysics).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • Radiation hardened 2Mbit SRAM in 180nm CMOS technology

    Arbat, A., Calligaro, C., Roizin, Y. & Nahmad, D., 2012, Proceedings - 2012 IEEE 1st AESS European Conference on Satellite Telecommunications, ESTEL 2012. IEEE Computer Society, (Proceedings - 2012 IEEE 1st AESS European Conference on Satellite Telecommunications, ESTEL 2012).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    16 Scopus citations

  • Radiation sensor based on a floating gate device

    Pikhay, E., Nemirovsky, Y., Roizin, Y., Dayan, V., Lavrenkov, K., Leibovich, Y. & Epstein, D., 2012, 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012. 6377101. (2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    6 Scopus citations

  • SkyFlash EC project: Architecture for a 1Mbit S-Flash for space applications

    Arbat, A., Calligaro, C., Dayan, V., Pikhay, E. & Roizin, Y., 2012, 2012 19th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2012. p. 617-620 4 p. 6463671. (2012 19th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2012).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    5 Scopus citations

  • Ultraviolet to near infrared response of optically triggered nonvolatile memories based on platinum nano-particles and high-k dielectrics on a SOI Substrate

    Mikhelashvili, V., Shneider, Y., Meyler, B., Yofis, S., Salzman, J., Atiya, G., Cohen-Hyams, T., Kaplan, W. D., Lisiansky, M., Roizin, Y., Ankonina, G. & Eisenstein, G., 2012, 2012 4th Electronic System-Integration Technology Conference, ESTC 2012. IEEE Computer Society, 6542217. (2012 4th Electronic System-Integration Technology Conference, ESTC 2012).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • 2010

    Compact instrumentation for radiation tolerance test of flash memories in space environment

    Pace, C., Della Sala, E., Capuano, G., Libertino, S., Crupi, I., Marino, A., Lombardo, S., Lisiansky, M. & Roizin, Y., 2010, 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings. p. 652-655 4 p. 5488118. (2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • Non-volatile memories in the foundry business

    Strum, A., Mahlen, T. & Roizin, Y., 2010, 2010 IEEE International Memory Workshop, IMW 2010. 5488394. (2010 IEEE International Memory Workshop, IMW 2010).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    7 Scopus citations

  • Zero-cost MTP high density NVM modules in a CMOS process flow

    Atrash, A., Cassuto, G., Chen, W., Dayan, V., Galzur, O., Gutman, M., Heiman, A., Hunsinger, G., Nahmad, D., Parag, A., Pikhay, E., Roizin, Y., Smith, B., Strum, A., Tishbi, T. & Teggatz, R., 2010, 2010 IEEE International Memory Workshop, IMW 2010. 5488313. (2010 IEEE International Memory Workshop, IMW 2010).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    6 Scopus citations
  • 2009

    High density MTP logic NVM for power management applications

    Roizin, Y., Pikhay, E., Dayan, V. & Heiman, A., 2009, 2009 IEEE International Memory Workshop, IMW '09. 5090593. (2009 IEEE International Memory Workshop, IMW '09).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    7 Scopus citations
  • 2008

    C-Flash: An ultra-low power single poly logic NVM

    Roizin, Y., Aloni, E., Birman, A., Dayan, V., Fenigstein, A., Nahmad, D., Pikhay, E. & Zfira, D., 2008, 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design, Proceedings, NVSMW/ICMTD. p. 90-92 3 p. 4531832. (2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design, Proceedings, NVSMW/ICMTD).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    25 Scopus citations

  • Radiation effects on programmed NROM cells

    Corso, D., Palermo, A., Palumbo, F., Libertino, S., Lombardo, S., Lisiansky, M. & Roizin, Y., 2008, ECS Transactions - Microelectronics Technology and Devices - SBMicro 2008. 1 ed. p. 311-317 7 p. (ECS Transactions; vol. 14, no. 1).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • 2007

    Computer and experimental study of the gate dielectric in a memory transistor

    Avichail-Bibi, R., Fuks, D., Kiv, A. & Roizin, Y., 2007, Computational Methods and Experimental Measurements XIII. p. 65-74 10 p. (WIT Transactions on Modelling and Simulation; vol. 46).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    Open Access
  • 2006

    Extending endurance of NROM memories to over 10 million program/erase cycles

    Roizin, Y., Pikhay, E., Lisiansky, M., Heiman, A., Alon, E., Aloni, E. & Fenigstein, A., 2006, 21st IEEE Non-Volatile Semiconductor Memory Workshop 2006, NVSMW 2006. p. 74-75 2 p. 1629501. (21st IEEE Non-Volatile Semiconductor Memory Workshop 2006, NVSMW 2006; vol. 2006).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    4 Scopus citations

  • ISSG-SiNGEN ONO stack for nrom memory: Electrical and chemical characterization

    Lisiansky, M., Heiman, A., Garteiz, G., Alon, E., Fenigstein, A., Roizin, Y., Gladkikh, A., Oksman, M., Edrei, R., Hoffman, A., Xing, G. & Cautiero, G., 2006, Dielectrics in Emerging Technologies -and- Persistent Phosphors, Joint Proceedings of the International Symposia. p. 60-79 20 p. (Proceedings - Electrochemical Society; vol. PV 2005-13).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • 2004

    ONO charging at different stages of microFlash® process flow

    Lisiansky, M., Roizin, Y., Gutman, M., Keysar, S., Ben-Guigui, A. & Berreby, M., 2004, 2004 International Conference on Integrated Circuit Design and Technology, ICICDT. p. 231-235 5 p. (2004 International Conference on Integrated Circuit Design and Technology, ICICDT).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations
  • 2003

    Plasma-induced charging in two bit per cell SONOS memories

    Roizin, Y., Gutman, M., Yosefi, R., Alfassi, S. & Aloni, E., 2003, 2003 8th International Symposium on Plasma- and Process-Induced Damage, P2ID 2003. Eriguchi, K., Krishnan, S. & Hook, T. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 61-64 4 p. 1200914. (International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings; vol. 2003-January).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    4 Scopus citations

  • Structure, chemistry, and electrical performance of silicon oxide-nitride-oxide stacks on silicon

    Levin, I., Kovle, M., Leapmad, R. D., Yoder, D., Fischer, D. & Roizin, Y., 2003, 2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 248-249 2 p. 1272082. (2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review