Keyphrases
180 Nm Technology
27%
Aluminum Oxide
14%
Bottom Oxide
17%
CMOS Dosimeter
17%
CMOS Technology
16%
Deep Traps
16%
Downscaling
16%
Electrostatically Formed Nanowire
20%
Exoelectron Emission
13%
Field-effect Transistors
15%
Flash Memory
16%
Floating Gate
47%
Foundry
14%
Gate Dielectric
15%
HfO2
12%
High-k Dielectric
14%
Hole Trapping
13%
Injected Charge
13%
Irradiation
16%
Label-free
13%
Label-free Sensing
13%
Low Power
27%
Memory Array
18%
Memory Cell
47%
Memory Device
25%
Memory Transistors
30%
Memristor
14%
Nanochannel
17%
Neuromorphic Computing
13%
Nitrided Oxide
56%
Nitrides
25%
Non-volatile
15%
Non-volatile Memory
67%
Oxide Nitride
57%
Oxide Stack
25%
Polysilicon
20%
Rad-hard
14%
Radiation Dose
18%
Radiation Effects
15%
Radiation Sensor
36%
Read Only Memory
18%
Sensor-based
15%
Silica
31%
Silicon Nitride
30%
Silicon Oxide
35%
Silicon-on-insulator
14%
Single-poly
24%
SONOS Memory
17%
Standard CMOS Technology
13%
Ultra-low Power
19%
Material Science
Activation Energy
7%
Al2O3
8%
Aluminum Oxide
5%
Amorphous Material
13%
Amorphous Silicon
12%
Annealing
5%
Boron Ion
5%
Capacitance
5%
Capacitor
11%
Charge Carrier
6%
Charge Trapping
7%
Complementary Metal-Oxide-Semiconductor Device
7%
Crystalline Material
5%
Density
19%
Dielectric Material
41%
Dielectric Property
6%
Electron Energy Loss Spectrometry
6%
Electronic Circuit
6%
Field Effect Transistor
31%
Film
27%
Hot Electron
12%
Materials Degradation
5%
Nanocrystalline Material
21%
Nanoparticle
8%
Nanowire
21%
Neuromorphic Computing
10%
Nitride Compound
71%
Oxidation Reaction
10%
Oxide Compound
76%
Oxynitride
5%
Platinum
8%
Secondary Ion Mass Spectrometry
7%
Silicon
100%
Silicon Device
8%
Silicon Memory
13%
Silicon Nitride
34%
Thin Films
6%
Transistor
73%
Engineering
Activation Energy
10%
Antenna
8%
Beam Radiation
6%
Biological Interaction
9%
Biosensor
12%
Communication Service
6%
Coulomb Repulsion
6%
Current Source
8%
Dielectrics
19%
Double Layer
10%
Dynamic Range
11%
Electric Power Utilization
6%
Electron Energy
8%
Electron Injection
12%
Electrostatics
12%
Energy Dissipation
8%
Erase Operation
7%
Field Programmable Gate Arrays
6%
Field-Effect Transistor
20%
Fits and Tolerances
10%
Flash Memory
19%
Floating Gate
47%
Gate Dielectric
8%
Gate Induced Drain Leakage
8%
Hot Electron
8%
Ionizing Radiation
15%
Medical Implant
6%
Memory Array
12%
Nanowires
21%
Nitride
20%
Nonvolatile Memory
49%
Operating Regime
6%
Oxide-Nitride-Oxide
18%
Polysilicon
15%
Power Management
6%
Process Flow
9%
Radiation Effect
8%
Radio Frequency Identification
12%
Radiotherapy
8%
Sensing Performance
7%
Silicon Device
8%
Silicon Memory
8%
Silicon on Insulator
9%
Silicon Oxide
12%
Silicon-Oxide-Nitride-Oxide-Silicon
8%
Space Application
12%
Stack Memory
8%
System-on-Chip
7%
Transmissions
7%
Tunnel Construction
7%
