Keyphrases
Aluminum Nitride Thin Film
12%
Aluminum Oxide
23%
Atom Probe Tomography
13%
Atomic Structure
13%
Boundary Control
12%
Crack Formation
14%
Crystal Growth
13%
Crystal Orientation
22%
CuO Thin Films
18%
Current Response
14%
Dislocation
41%
Dopant Segregation
12%
Effective Electrical Properties
12%
Electrical Conductivity
93%
Electrical Properties
13%
Enhanced Electrical Conductivity
12%
Evaporation Parameter
12%
Fe Segregation
12%
Fe2VAl
16%
Four-point Probe
16%
Glycine
15%
Grain Boundary
85%
Grain Boundary Phase
12%
Grain Boundary Resistivity
19%
Half-Heusler
12%
Heusler Compounds
14%
High Angle
15%
Hybridization Effect
12%
In Situ
17%
Laser Surface Melting
25%
Mechanical Pressure
36%
Metal Case
12%
Metallic Glass Thin Film
12%
Microstructure
52%
Microstructure Manipulation
12%
Nanocrystals
50%
Nanoindentation
15%
Nanoindentation Pop-in
14%
Nanopore
25%
Piezoresistive Sensing
12%
Polymorphism
12%
Pore Volume Fraction
12%
Pressure Change
17%
Resistivity
40%
Room Temperature
29%
Rutile
15%
Symmetric Tilt Grain Boundary
12%
Thermoelectric Performance
20%
Thermoelectric Properties
16%
Transport Properties
16%
Material Science
Aluminum
12%
Aluminum Nitride
12%
Aluminum Oxide
28%
Amino Acids
12%
Amorphous Metal
12%
Analytical Method
6%
Atom Probe
10%
Atomic Force Microscopy
12%
Atomic Structure
7%
Crack Formation
16%
Crystal Defect
12%
Crystal Growth
12%
Doping (Additives)
14%
Electrical Conductivity
50%
Electrical Impedance
12%
Electrical Resistivity
75%
Electron Backscatter Diffraction
7%
Film
25%
Finite Element Method
12%
Focused Ion Beam
6%
Fracture Toughness
12%
Functional Ceramics
12%
Grain Boundary
100%
Grain Size
6%
Heusler Compound
14%
Homogenization
18%
Indentation
8%
Lithium
12%
Nanocrystalline
12%
Nanocrystalline Material
16%
Nanoindentation
27%
Nanopore
25%
Nucleation
8%
Oxide Ceramics
8%
Oxide Compound
16%
Piezoelectricity
50%
Polycrystal
6%
Pore Volume
12%
Sapphire
10%
Scanning Electron Microscopy
6%
Single Crystal
16%
Surface (Surface Science)
36%
Surface Energy
6%
Thermal Conductivity
9%
Thermoelectrics
40%
Thin Films
61%
Titanium Dioxide
29%
Tomography
10%
Volume Fraction
12%
X-Ray Diffraction
6%
Engineering
Aluminum Oxide
8%
Aluminum Substrate
12%
Applicability
12%
Atomic Arrangement
8%
Atomic Force Microscopy
6%
Bridging
6%
Bulk Material
6%
Computational Homogenisation
6%
Conductive
6%
Crystallographic Orientation
5%
Electrical Conductivity
25%
Electrical Impedance
6%
Electrical Measurement
6%
Electronic Conductivity
12%
Finite Element Analysis
6%
Focused Ion Beam
6%
Fracture Strength
12%
Fundamental Relation
6%
Illustrates
6%
Interfacial Energy
10%
Intermetallics
5%
Limitations
8%
Macro Level
6%
Material Microstructure
6%
Material Response
6%
Material System
12%
Microcantilevers
7%
Microscale
12%
Multiscale
25%
Nanocrystalline
12%
Nanoscale
12%
Nitride
15%
One Dimensional
12%
Piezoelectric
25%
Polycrystal
6%
Pore Shape
6%
Porosity
12%
Probe Point
9%
Room Temperature
12%
Sapphire Substrate
6%
Scaling Law
6%
Simulation Result
6%
Space Charge
6%
Tailored Property
6%
Thin Films
35%
